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IMA™ Hyperspectral Microscope

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IMA™ Hyperspectral Microscope

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The IMA™ hyperspectral microscopy platform delivers equally high spectral and spatial resolution. Have this modular system configured to rapidly scan the VIS, NIR and/or SWIR spectra while mapping a combination of photoluminescence, electroluminescence, fluorescence, reflectance, and/or transmittance. Each IMA™ comes equipped with high throughput global imaging filters; this allows it to measure a megapixel hypercube faster than hyperspectral systems reliant on scanning spectrography.

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Product Description

The IMA™ hyperspectral microscopy platform delivers equally high spectral and spatial resolution. Have this modular system configured to rapidly scan the VIS, NIR and/or SWIR spectra while mapping a combination of photoluminescence, electroluminescence, fluorescence, reflectance, and/or transmittance. Each IMA™ comes equipped with high throughput global imaging filters; this allows it to measure a megapixel hypercube faster than hyperspectral systems reliant on scanning spectrography.

IMA™ opens the door to:

  • Perform complex material analyses like solar cell characterization and semiconductor quality control (e.g.: perovskite, GaAs, SiC, CIS, CIGS, etc.).
  • Study IR markers in complex environments including live cells and tissue. Take for instance the spectral heterogeneity of IR fluorophores emitting in the second biological window.
  • Retrieve dark-field images and obtain a contrast of transparent and unstained samples such as polymers, crystals or live cells.

Characteristics:

  • Fast global mapping (non-scanning)
  • High spatial and spectral resolution
  • Complete system (source, microscope, camera, filter, software)
  • Non-destructive analysis
  • Customization available
  • Sensitive from 400 to 1200 nm in the visible and from 900 nm up to 1700 nm in the SWIR range
SPECTRAL RANGE
VIS - SWIR Model
400 - 1620 nm
VIS
400-1000 nm
SWIR
900-1620 nm
SPECTRAL RESOLUTION
< 2 nm
< 4 nm
CAMERA
CCD, EMCCD, sCMOS
ZephIR 1.7
EXCITATION WAVELENGTHS
(up to 3 lasers)
405, 447, 532, 561, 660, 730, 785 or 808 nm
MICROSCOPEUpright or Inverted; Scientific Grade
SPATIAL RESOLUTIONSub-micron
(limited by the microscope objective N.A.)
MAXIMUM SAMPLE SIZE10 cm × 10 cm
X, Y TRAVEL RANGE76 mm × 52 mm
Z-STAGE RESOLUTION100 nm
ILLUMINATION
Illumination option
Diascopic, Episcopic, LED, HG
Epifluorescence module, Darkfield module
WAVELENGTH ABSOLUTE ACCURACY0.25 nm
VIDEO MODEMegapixel camera for sample visualization
DATA PROCESSINGSpatial filtering, statistical tools, spectrum extraction, data normalization, spectral calibration, overlay, central position map, etc.
HYPERSPECTRAL DATA FORMATHDF5, FITS
SINGLE IMAGE DATA FORMATHDF5, CSV, JPG, PNG, TIFF
SOFTWAREPHySpec™ control and analysis (computer included)
DIMENSIONS≅ 150 cm × 85 cm 82 cm
WEIGHT≅ 80 kg

Hyperspectral characterization of next-generation solar cells and LEDs

This video shows how spectrally and spatially resolved PL and EL maps can help identify defects, losses, and uniformity in advanced materials. A hyperspectral photoluminescence demonstration is performed on large grain perovskite crystals.

Download Spec Sheet